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39 document(s) listed.
| Document No. | DD | Document Date | Computer Entry Date | Title | ||||
|---|---|---|---|---|---|---|---|---|
| X1-8352-02 | ER | 04-JAN-06 | 17-DEC-08 | CHARACTERIZATION OF THE 4MB CHALCOGENIDE-RANDOM ACCESS MEMORY | ||||
| X1-8352-03 | TR | 03-JUN-08 | 17-DEC-08 | HIGHLY ACCELERATED TESTING OF CAPACITORS FOR MEDICAL APPLICATIONS | ||||
| X1-8352-04 | ER | 13-JUN-07 | 17-DEC-08 | PREDICTING THE PERFORMANCE OF CATHODIC PROTECTION SYSTEMS WITH LARGE SCALE INTERFERENCE | ||||
| X1-8352-05 | ER | 13-JUN-07 | 17-DEC-08 | PREDICTING CORROSION RELATED SIGNATURES | ||||
| NASA 8350-01 | TR | 01-DEC-07 | 15-DEC-08 | RELIABILITY EFFECTS OF SURGE CURRENT TESTING OF SOLID TANTALUM CAPACITORS | ||||
| D-31229 | TR | 01-JAN-05 | 08-DEC-08 | PROGRAMMABLE OSCILLATORS | ||||
| NASA 8343-01 | ER | 01-JUN-06 | 08-DEC-08 | PERFORMANCE EVALUATION OF AN SOI SILICON-ON-INSULATOR CRYSTAL CLOCK GENERATOR UNDER EXTREME TEMPERATURES | ||||
| NASA 8343-02 | ER | 01-FEB-06 | 08-DEC-08 | OPERATION OF AN SOI (SILICON-ON-INSULATOR) N-CHANNEL POWER FIELD EFFECT TRANSISTOR UNDER EXTREME TEMPERATURES AND THERMAL CYCLING | ||||
| NASA 8343-03 | ER | 24-OCT-05 | 08-DEC-08 | TESTING AND HARDNESS ASSURANCE GUIDELINES FOR SINGLE EVENT TRANSIENTS (SETS) IN LINEAR DEVICES | ||||
| NASA 8343-05 | TR | 01-DEC-05 | 08-DEC-08 | PERFORMANCE OF PRECISION FLOATING GATE ANALOG VOLTAGE REFERENCES AT CRYOGENIC TEMPERATURES | ||||
| NASA 8343-06 | ER | 27-FEB-04 | 08-DEC-08 | APPLICATION OF THERMO-MECHANICAL MEASUREMENTS OF PLASTIC PACKAGES FOR RELIABILITY EVALUATION OF PEMS | ||||
| NASA 8343-07 | ER | 08-OCT-04 | 08-DEC-08 | IMPACT OF PROTON IRRADIATION ON THE RF PERFORMANCE OF 0.12 MICRO M CMOS TECHNOLOGY | ||||
| NASA TM 2005-213560 | ER | 01-MAR-05 | 08-DEC-08 | THERMAL EVALUATION OF FIBER BRAGG GRATINGS AT EXTREME TEMPERATURES | ||||
| NASA 8340-01 | ER | 01-SEP-06 | 05-DEC-08 | OPERATION OF A TRANSISTOR DRIVER UNDER EXTREME TEMPERATURES AND THERMAL CYCLING | ||||
| NASA 8340-02 | TR | 23-AUG-04 | 05-DEC-08 | OPERATION OF LINEAR TECHNOLOGY LTC6906 SILICON OSCILLATOR AT EXTREME TEMPERATURES | ||||
| NASA 8340-03 | STL | 02-JAN-03 | 05-DEC-08 | CHOOSING THE RIGHT LEAD-FREE SOLDER FOR HI-REL PRINTED WIRING ASSEMBLIES | ||||
| NASA 8340-04 | TR | 26-AUG-04 | 05-DEC-08 | ENVIRONMENTAL STRESS TESTING OF POWER TRANSISTORS ENCAPSULATED IN PLASTIC PACKAGES | ||||
| NASA 8340-05 | TR | 01-FEB-06 | 05-DEC-08 | PERFORMANCE OF NEW SIGE METAL-INSULATOR-SEMICONDUCTOR FIELD EFFECT TRANSISTORS UNDER EXTREME TEMPERATURES | ||||
| NASA 8339-01 | TR | 27-OCT-06 | 04-DEC-08 | PERFORMANCE OF ANALOG DEVICES AD8065 SOI OPERATIONAL AMPLIFIER UNDER WIDE TEMPERATURE CYCLING | ||||
| NASA 8339-02 | ER | 01-JUN-06 | 04-DEC-08 | SILICON-ON-INSULATOR PRECISION TIMERS FOR EXTREME TEMPERATURES | ||||
| NASA 8338-01 | ER | 01-OCT-05 | 03-DEC-08 | EFFECT OF INDUCTANCE AND REQUIREMENTS FOR SURGE CURRENT TESTING OF TANTALUM CAPACITORS | ||||
| NASA 8338-02 | ER | 01-JUN-05 | 03-DEC-08 | HIGH-TEMPERATURE DEGRADATION OF WIRE BONDS IN PLASTIC ENCAPSULATED MICROCIRCUITS | ||||
| NASA 8338-03 | ER | 18-APR-06 | 03-DEC-08 | DEMONSTRATION OF 500 DEGREE C AC AMPLIFIER BASED ON SIC MESFET AND CERAMIC PACKAGING | ||||
| NASA 8338-04 | TR | 05-NOV-04 | 03-DEC-08 | EFFECTS OF HEAVY ION EXPOSURE ON NANOCRYSTAL NONVOLATILE MEMORY | ||||
| NASA JPL D-27440 | ER | 26-APR-04 | 03-DEC-08 | EVALUATION OF NON-EVAPORABLE GETTERS FOR HIGH VACUUM HERMETIC PACKAGES FINAL REPORT JPL D-27440 | ||||
| NASA 8337-01 | ER | 01-OCT-05 | 02-DEC-08 | EFFECT OF ENVIRONMENTS ON DEGRADATION OF MOLDING COMPOUND AND WIRE BONDS IN PEMS | ||||
| NASA CL 07-1924 | ER | 07-AUG-06 | 02-DEC-08 | CHARACTERIZATION OF TANTALUM POLYMER CAPACITORS FINAL REPORT 2006 | ||||
| X1-8337-01 | ER | 15-MAY-08 | 02-DEC-08 | LOWER COST PACKAGING TECHNOLOGIES: EXPLORING THE BENEFITS OF COPPER WIREBONDING | ||||
| X1-ARL-TR-4355 | ER | 01-JAN-08 | 02-DEC-08 | FINITE-ELEMENT MICROMECHANICAL STRENGTH MODELING AND PARAMETRIC INVESTIGATION OF THREE-DIMENSIONAL ORTHOGONAL COMPOSITES | ||||
| NASA 8336-01 | ER | 01-APR-06 | 01-DEC-08 | PERFORMANCE OF A 3.3V SOI VOLTAGE REGULATOR UNDER EXTREME TEMPERATURES | ||||
| NASA 8336-02 | ER | 17-MAY-05 | 01-DEC-08 | SELECTION AND QUALIFICATION OF FOUNDRIES FOR CMOS INTEGRATED CIRCUITS | ||||
| NASA 8336-03 | ER | 20-OCT-06 | 01-DEC-08 | NICKEL CADMIUM BATTERIES A MEDIUM FOR THE STUDY OF METAL WHISKERS AND DENDRITES | ||||
| NASA 8336-04 | ER | 01-SEP-06 | 01-DEC-08 | EVALUATION OF CONFORMAL COATINGS AS A TIN WHISKER MITIGATION STRATEGY, PART II | ||||
| NASA 8336-05 | ER | 01-SEP-06 | 01-DEC-08 | TRACER DIFFUSION IN WHISKER-PRONE TIN PLATINGS | ||||
| NASA 8336-06 | STL | 01-MAY-08 | 01-DEC-08 | WHISKER GROWTH ON SAC SOLDER JOINTS MICROSTRUCTURE ANALYSIS | ||||
| NASA 8336-07 | ER | 07-NOV-05 | 01-DEC-08 | EFFECT OF AREA ARRAY PACKAGE TYPES ON ASSEMBLY RELIABILITY AND COMMENTS ON IPC-9701A | ||||
| NASA JPL D-31227 | ER | 01-NOV-05 | 01-DEC-08 | ANALYSIS OF PLASTIC PARTS PACKAGE DELAMINATION | ||||
| NASA JPL D-31335 | ER | 14-FEB-05 | 01-DEC-08 | DESIGN OF A HARDWARE/SOFTWARE PLATFORM FOR A COMPREHENSIVE DYNAMIC BURN-IN TEST OF SRAM-BASED FIELD PROGRAMMABLE GATE ARRAYS | ||||
| NASA TP-2003-XXXXXX | ER | 01-MAY-03 | 01-DEC-08 | PEM-INST-001 INSTRUCTIONS FOR PLASTIC ENCAPSULATED MICROCIRCUIT PEM SELECTION, SCREENING, AND QUALIFICATION | ||||
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